Lasertec (TYO:6920) unveiled its new Optelics IR confocal microscope designed for high-resolution infrared observation and measurement, according to a Monday filing with the Tokyo Stock Exchange.

The microscope features high-brightness IR optics, enabling non-destructive analysis of silicon wafers and IR-transmissive materials. It is particularly suited for R&D and process optimization in the growing advanced packaging market, including applications such as alignment measurement, void detection, and adhesive peeling observation, the company said.

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