Aehr Test Systems, a global supplier of semiconductor test and burn-in equipment, will be presenting at the William Blair 45th Annual Growth Stock Conference in Chicago on June 3. President and CEO Gayn Erickson, along with CFO Chris Siu, will discuss the company's innovative wafer level test and packaged part burn-in solutions for semiconductor production. The presentation will highlight Aehr Test's recent acquisition of Incal Technology and their new high power packaged part reliability test solutions, which expand their market presence in the growing artificial intelligence semiconductor sector.
Disclaimer: This news brief was created by Public Technologies (PUBT) using generative artificial intelligence. While PUBT strives to provide accurate and timely information, this AI-generated content is for informational purposes only and should not be interpreted as financial, investment, or legal advice. Aehr Test Systems published the original content used to generate this news brief on May 28, 2025, and is solely responsible for the information contained therein.