Aehr Test Systems, a global supplier of semiconductor test and burn-in equipment, will be presenting at the William Blair 45th Annual Growth Stock Conference in Chicago on June 3. President and CEO Gayn Erickson, along with CFO Chris Siu, will discuss the company's innovative wafer level test and packaged part burn-in solutions for semiconductor production. The presentation will highlight Aehr Test's recent acquisition of Incal Technology and their new high power packaged part reliability test solutions, which expand their market presence in the growing artificial intelligence semiconductor sector.
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