中芯国际集成电路制造(北京)有限公司测试电路、测试方法以及芯片专利公布(集成电路测试专利快讯)

iDoNews
May 20, 2025

天眼查App显示,2025年5月20日,“测试电路、测试方法以及芯片”正式进入专利的公布阶段。申请人为中芯国际集成电路制造(北京)有限公司、中芯国际集成电路制造(上海)有限公司,该项集成电路测试专利涉及芯片静电放电保护技术的应用场景。据专利信息显示,该发明能够显著优化芯片静电放电模块的防护效果,提高测试结果的可靠性。发明人为郭俊男。专利摘要指出,一种测试电路、测试方法以及芯片,测试电路包括:被保护...

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