天眼查App显示,2025-12-30,“测试块状样品微结构的方法和测试块状样品微结构的装置”正式进入公布阶段。申请人为北京建筑材料科学研究总院有限公司,北京金隅集团股份有限公司,该项测量测试专利涉及材料微结构分层分析技术场景。据专利信息显示,通过纱网精细打磨结合XRD与IR协同测试,实现对块状样品微米级分层的晶体矿相与有机基团空间分布检测,技术效果数据提升达显著优化。发明人为章银祥;陈旭辉;高志...
Source Link天眼查App显示,2025-12-30,“测试块状样品微结构的方法和测试块状样品微结构的装置”正式进入公布阶段。申请人为北京建筑材料科学研究总院有限公司,北京金隅集团股份有限公司,该项测量测试专利涉及材料微结构分层分析技术场景。据专利信息显示,通过纱网精细打磨结合XRD与IR协同测试,实现对块状样品微米级分层的晶体矿相与有机基团空间分布检测,技术效果数据提升达显著优化。发明人为章银祥;陈旭辉;高志...
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