消息称三星电子1c DRAM良率超80% HBM4良率接近60%

金吾财讯
Feb 25

金吾财讯 | 业内人士透露,三星电子内部已实现1c DRAM 80%的良率,这是在高温环境下(热测试)取得的最高良率,2025年第四季度其良率约为60-70%,如今已显著提升,并有望在5月份左右达到90%。业内人士进一步表示,三星基于1c DRAM的HBM4的良率也有所提高,已接近60%,去年第四季度约为50%。

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